Apr 30, 2026  
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Rensselaer Catalog 2025-2026

MTLE 6080 - Electron Microscopy of Materials

Introduction to electron optics, electron diffraction contrast mechanisms, specimen preparation, and microanalysis. Theory and operating fundamentals of the SEM, TEM, STEM, and the electron microprobe. Analysis of images from crystalline materials using kinematical and dynamical theories of electron diffraction. Includes laboratory component.

Prerequisite: Prior knowledge of MTLE 2100  or MTLE 6040 .

When Offered: AVAILABILITY OF INSTRUCTOR

Graded: GRADED

Credit Hours: 3