Apr 19, 2024  
Rensselaer Catalog 2009-2010 
    
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Rensselaer Catalog 2009-2010 [Archived Catalog]

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MTLE 6080 - Electron Microscopy of Materials

Introduction to electron optics, electron diffraction contrast mechanisms, specimen preparation, and microanalysis. Theory and operating fundamentals of the SEM, TEM, STEM, and the electron microprobe. Analysis of images from crystalline materials using kinematical and dynamical theories of electron diffraction.

Prerequisites/Corequisites: Prerequisite: MTLE 2100 or MTLE 6040.

When Offered: Fall term annually.



Credit Hours: 3


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