| |
Mar 13, 2026
|
|
|
|
|
Rensselaer Catalog 2007-2008 [Archived Catalog]
|
MTLE 6430 - Materials Characterization Principles and applications of current techniques for the chemical, structural, and morphological characterization of engineering materials, with an emphasis on materials used in the microelectronics industry. Techniques studied include various electron and ion spectroscopies, electron microscopies, and diffraction techniques.
When Offered: Fall term odd numbered years.
Credit Hours: 3
|
|