May 01, 2026  
Rensselaer Catalog 2024-2025 
    
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Rensselaer Catalog 2024-2025 [Archived Catalog]

MTLE 6080 - Electron Microscopy of Materials

Introduction to electron optics, electron diffraction contrast mechanisms, specimen preparation, and microanalysis. Theory and operating fundamentals of the SEM, TEM, STEM, and the electron microprobe. Analysis of images from crystalline materials using kinematical and dynamical theories of electron diffraction. Includes laboratory component.

Prerequisites/Corequisites: Prerequisite: MTLE 2100  or MTLE 6040 .

When Offered: Upon availability of instructor.

Credit Hours: 3