Dec 30, 2024  
Rensselaer Catalog 2016-2017 
    
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Rensselaer Catalog 2016-2017 [Archived Catalog]

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MTLE 6080 - Electron Microscopy of Materials

Introduction to electron optics, electron diffraction contrast mechanisms, specimen preparation, and microanalysis. Theory and operating fundamentals of the SEM, TEM, STEM, and the electron microprobe. Analysis of images from crystalline materials using kinematical and dynamical theories of electron diffraction. Includes laboratory component.

Prerequisites/Corequisites: Prerequisite: MTLE 2100 or MTLE 6040.

When Offered: Upon availability of instructor.



Credit Hours: 3


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