Mar 29, 2024  
Rensselaer Catalog 2008-2009 
    
Rensselaer Catalog 2008-2009 [Archived Catalog]

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MTLE 6430 - Materials Characterization


Principles and applications of current techniques for the chemical, structural, and morphological characterization of engineering materials, with an emphasis on materials used in the microelectronics industry. Techniques studied include various electron and ion spectroscopies, electron microscopies, and diffraction techniques.

When Offered: Fall term odd numbered years.



Credit Hours: 3



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