Jul 06, 2020  
Rensselaer Catalog 2014-2015 
    
Rensselaer Catalog 2014-2015 [Archived Catalog]

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MTLE 6430 - Materials Characterization


Principles and applications of current techniques for the chemical, structural, and morphological characterization of engineering materials, with an emphasis on materials used in the microelectronics industry. Techniques studied include various electron and ion spectroscopies, electron microscopies, and diffraction techniques.

When Offered: Upon availability of instructor.



Credit Hours: 3



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