Jul 10, 2020  
Rensselaer Catalog 2014-2015 
    
Rensselaer Catalog 2014-2015 [Archived Catalog]

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MTLE 6080 - Electron Microscopy of Materials


Introduction to electron optics, electron diffraction contrast mechanisms, specimen preparation, and microanalysis. Theory and operating fundamentals of the SEM, TEM, STEM, and the electron microprobe. Analysis of images from crystalline materials using kinematical and dynamical theories of electron diffraction.  Includes laboratory component.

Prerequisites/Corequisites: Prerequisite: MTLE 2100 or MTLE 6040.

When Offered: Upon availability of instructor.



Credit Hours: 3



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